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作 者:钱晨 杨建文[2] 杨杨 杨斌[1] QIAN Chen;YANG Jianwen;YANG Yang;YANG Bin(School of Energy and Power Engineering,University of Shanghai for Science and Technology,Shanghai 200093,China;Xi’an Aerospace Propulsion Institute,Xi’an 710100,China)
机构地区:[1]上海理工大学能源与动力工程学院,上海200093 [2]西安航天动力研究所,西安710100
出 处:《上海理工大学学报》2025年第1期38-44,共7页Journal of University of Shanghai For Science and Technology
基 金:国家自然科学基金资助项目(52306215,51806144)。
摘 要:针对竖直壁面上的流动降膜特性问题,研究了基于平面激光诱导荧光法的液膜厚度测量方法,通过液膜厚度标定装置获得了图像灰度与厚度的对应关系,搭建了溢流式降膜流动循环实验系统,开展了不同体积流量下竖直壁面降膜厚度测量,同时开展了对应实验工况不同雷诺数竖直壁面降膜流动数值模拟研究。液膜厚度实验测量结果与数值模拟结果相对偏差最小为5.5%,最大为11.4%。在此基础上,重点研究了雷诺数对竖直壁面降膜厚度的影响,结果显示:壁面切应力和气液界面剪切力是导致液膜波动的主要因素;随着雷诺数的增加,因液体流动速度增加引起壁面切应力与气液界面剪切力差值加剧,液膜波动的振幅增加。In order to study the problem of falling film flow characteristics on the vertical wall,the liquid film thickness measurement method based on planar laser-induced fluorescence method was studied.The corresponding relationship between image grayscale and thickness was obtained through a liquid film thickness calibration device.An overflow type falling film flow cycle experimental system was constructed and the falling film thickness on the vertical wall under different volume flow rates was measured.At the same time,numerical simulation of vertical wall falling film flow under different Reynolds numbers were conducted under corresponding experimental conditions.The relative deviation between the experimental measurement results and the numerical simulation results of the liquid film thickness is 5.5%at least and 11.4%at most.On this basis,the influence of Reynolds number on the thickness of falling film on the vertical wall was mainly studied.The results show that wall shear stress and gas-liquid interface shear stress are the main factors leading to liquid film fluctuations.As the Reynolds number increases,the surface fluctuation of the liquid film intensifies due to the difference between wall shear stress and gas-liquid interface shear stress caused by the increase in liquid flow velocity.In addition the amplitude of the liquid film fluctuation increases.
关 键 词:竖直壁面降膜流动 液膜厚度 雷诺数 平面激光诱导荧光法 液膜波动
分 类 号:TK31[动力工程及工程热物理—热能工程]
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