有机电化学晶体管循环稳定性的衰退机理分析  

Mechanism analysis on the degradation of cycling stability in organic electrochemical transistors

作　　者：徐洁 解淼 黄伟 XU Jie;XIE Miao;HUANG Wei(School of Automation Engineering,University of Electronic Science and Technology of China,Chengdu 611731,China)

机构地区：[1]电子科技大学自动化工程学院,成都611731

出　　处：《电子科技大学学报》2025年第2期191-196,共6页Journal of University of Electronic Science and Technology of China

基　　金：国家自然基金面上项目(62273073);四川省中央引导地方科技发展专项(2023ZYD0161)。

摘　　要：有机电化学晶体管(organic electrochemical transistor, OECT)作为高效的离子-电子换能器在生物电子学领域受到了广泛关注。但当前具有超高循环稳定性的OECT仍然鲜有报道,成为了阻碍其进一步发展及商业化的瓶颈问题。为了探究循环稳定性测试过程中OECT性能衰退的规律及其机理,该文对比了平面结构和垂直结构的OECT在相同测试条件下的循环稳定性,并使用光学显微镜表征了测试前后的沟道区域形貌变化;同时还对比了垂直结构OECT在不同偏置条件下的性能衰退情况。实验结果表明:OECT循环稳定性的衰退是多方面因素共同作用的结果,其中离子的反复掺杂/去掺杂过程、源极/漏极上偏置电压以及非电容性法拉第副反应的产生都会加速OECT的性能衰退。Organic Electrochemical Transistors(OECTs)have garnered significant research interest inbioelectronics due to their efficient ion-electron transducing capability.However,there were few reports on OECTswith ultra-high cycling stability,which further inhibited their further development and commercialization.Here,toinvestigate the performance degradation mechanism of OECTs during cycling testing,the differences in cyclingstability between planar and vertical OECTs under identical testing conditions were compared,and morphologicalchanges pre-and post-testing were characterized using an optical microscope.Additionally,the performancedegradations of vertical OECTs were assessed under different bias conditions.It is indicated that the degradation inthe cycling stability of OECTs is attributed to majorly three factors,including repeated doping/de-doping processof ions,bias stress on the source/drain electrodes,and generation of non-capacitive faradaic side-reactions,whereall of which contribute to the accelerated performance degradation of OECTs.

关 键 词：有机电化学晶体管 循环稳定性 衰退机理 复合离子-电子半导体 生物电子学 

分 类 号：TN321[电子电信—物理电子学]