基于面阵单光子计数成像探测器的原子荧光色散检测技术  

Atomic Fluorescence Dispersion Detection Technique Based on Area Array Single Photon Counting Imaging Detector

作　　者：陶琛 张宏吉[1] 李春生[2] 何玲平[1] 马振予 陈波[1] 张然 TAO Chen;ZHANG Hong-Ji;LI Chun-Sheng;HE Ling-Ping;MA Zhen-Yu;CHEN Bo;ZHANG Ran(First Department of Space Optics,Changchun Institute of Optics,Fine Mechanics and Physics,Chinese Academy of Sciences,Changchun 130033,China;School of Instrumentation and Electrical Engineering,Jilin University,Changchun 130026,China;Department of Hand and Foot Surgery,The First Bethune Hospital of Jilin University,Changchun 130000,China;Laboratory of Engineering Equipment Integration,Suzhou Institute of Biomedical Engineering and Technology,Chinese Academy of Sciences,Suzhou 215163,China)

机构地区：[1]中国科学院长春光学精密机械与物理研究所,空间光学研究一部,长春130033 [2]吉林大学仪器科学与电气工程学院,长春130026 [3]吉林大学白求恩第一医院手足外科,长春130000 [4]中国科学院苏州生物医学工程技术研究所,工程装备集成研究室,苏州215163

出　　处：《分析化学》2025年第2期187-194,共8页Chinese Journal of Analytical Chemistry

基　　金：国家重点研发计划基础科研条件与重大科学仪器设备研发项目(No.2022YFF0708500);国家自然科学基金项目(No.62205331)资助。

摘　　要：基于微通道板(Microchannel plate,MCP)的面阵单光子计数成像探测器具有灵敏度高和暗计数率低等特点,已被应用于空间微弱紫外光谱信号的光学遥感探测领域。本研究采用面阵单光子计数成像探测器作为检测器、平场凹面光栅作为分光器、无极放电灯(Electrodeless discharge lamp,EDL)作为激发光源,搭建了一种适用于氢化物发生-原子荧光光谱法(Hydride generation-atomic fluorescence spectrometry,HG-AFS)的色散检测系统。对此系统进行了波长标定,并对面阵单光子计数成像探测器负高压和EDL稳定时间等参数进行了分析和优化。针对As元素和Bi元素在180~320 nm波长范围内的激发荧光特征谱线进行了分析,对257.3~306.7 nm范围内的散射干扰进行了讨论。结果表明,基于面阵单光子计数成像探测器的AFS色散检测系统初步实现了对HG-AFS荧光信号的检测和分析,有效避免了散射干扰对检测结果的影响。本系统具有结构简单、无需制冷控温、不含移动部件和可实现多波段同时测定等特点。The single photon counting imaging detector based on microchannel plate(MCP)has the characteristics of high sensitivity and low dark count rate,and has been applied to the optical remote sensing detection of weak ultraviolet spectral signals in space.In this work,by using planar array single photon counting imaging detector as the detector,flat-field concave grating as the splitter,and electrodeless discharge lamp(EDL)as the excitation light source,a dispersion detection system suitable for hydride generation-atomic fluorescence spectrometry(HG-AFS)was developed.The wavelength calibration of the system was carried out,and the negative high pressure and EDL stability time of the planar array single photon counting imaging detector were analyzed and optimized.The characteristic emission spectral lines of As and Bi elements excited in the wavelength range of 180-320 nm were analyzed,and the scattering interference in the wavelength range of 257.3-306.7 nm was discussed.The results showed that the AFS dispersion detection system based on the planar array single photon counting imaging detector could detect and analyze the HG-AFS fluorescence signal initially,and the influence of scattering interference on the detection results was effectively avoided.The system had the advantages including simple structure,no refrigeration and temperature control,no moving parts and simultaneous measurement of multi-band.

关 键 词：原子荧光光谱法 面阵单光子计数成像探测器 色散检测 紫外高灵敏度成像探测技术 

分 类 号：O657.3[理学—分析化学]