功率模块无功老化测试系统设计  

Design of Reactive Power Burn-in Test System for Power Module

作　　者：夏彦达 郭斌[1,2] 郑永军 陆艺[1] 闫晗[2] XIA Yanda;GUO Bin;ZHENG Yongjun;LU Yi;YAN Han(College of Metrology Measurement and Instrument,China Jiliang University;Hangzhou Wolei Intelligent Technology Co.,Ltd.)

机构地区：[1]中国计量大学计量测试与仪器学院 [2]杭州沃镭智能科技股份有限公司

出　　处：《仪表技术与传感器》2025年第2期45-51,共7页Instrument Technique and Sensor

基　　金：浙江省科技计划项目(2023C01061);国家市场监督管理总局科技计划项目(2022MK225);国家重点研发计划项目(2024YFF0619904)。

摘　　要：为了验证IGBT模块成品服役期内的可靠性,需要在模拟工况下对模块进行持续性能测试。因此,文中提出一种检测IGBT模块电流输出能力的无功老化测试方案,改变以往使用电机作为老化测试负载的方式,采用定制的三相电抗器作为负载,最大可对输出能力为600 A的IGBT模块进行老化测试,同时采用SPWM调制策略控制IGBT模块在三相电抗器中产生正弦电流,并搭建测试平台、开展实验验证。双脉冲测试结果表明:系统测试回路的杂散电感仅为19.2 nH,大幅度降低了测试系统自身对IGBT模块老化测试结果的影响。老化测试结果表明:测试系统能够稳定控制IGBT模块输出的电流等级,输出大电流误差在3%以内。可见,设计的无功老化测试系统具有杂散电感低、控制精度高的特点,满足老化测试需求。To verify the reliability of the finished IGBT module during its service life,it is necessary to perform a burn-in test on the modules under simulated conditions.Therefore,this paper proposed a burn-in test scheme for detecting current output capa-bility of IGBT modules,changing the way motors are used as burn-in test loads,and using a customized three-phase inductor as the burn-in test load,which can perform the burn-in test on the IGBT modules with the maximum current output capacity of 600 A.At the same time,the SPWM modulation strategy was used to control the IGBT module to generate sinusoidal current in the three-phase inductor,and the test platform was set up to carry out experimental verification.The double pulse test shows that the stray inductance of the test loop is only 19.2 nH,which can greatly reduce the influence of the test system on the burn-in test.The burn-in test shows that the test system can better control the output current level of IGBT module,and the error of the output high current is within 3%.It can be seen that system has the characteristics of low stray inductance and high control accuracy,and can meet the demand of burn-in test.

关 键 词：IGBT模块 老化测试 采样电路 正弦脉宽调制 过流保护 杂散电感 

分 类 号：TN322[电子电信—物理电子学]