Improvement of Lattice Parameter Accuracy in Single Crystal XRD Based on a Laser-Induced X-Ray Source  

基于激光X射线源单晶XRD的晶格参数精度提升

作　　者：LIU Jin WANG Qiannan LI Jiangtao 刘进;王倩男;李江涛(中国工程物理研究院流体物理研究所冲击波物理与爆轰物理全国重点实验室,四川绵阳621999;海南大学皮米电镜中心,海洋材料表征技术创新研究院,精密仪器高等研究中心,海南海口570228;西南科技大学环境友好能源材料国家重点实验室,四川绵阳621010)

机构地区：[1]National Key Laboratory of Shock Wave and Detonation Physics,Institute of Fluid Physics,China Academy of Engineering Physics,Mianyang 621999,Sichuan,China [2]Pico Electron Microscopy Center,Innovation Institute for Ocean Materials Characterization Technology,Center for Advanced Studies in Precision Instrument,Hainan University,Haikou 570228,Hainan,China [3]State Key Laboratory for Environment-Friendly Energy Materials,Southwest University of Science and Technology,Mianyang 621010,Sichuan,China

出　　处：《高压物理学报》2025年第4期9-15,共7页Chinese Journal of High Pressure Physics

基　　金：National Natural Science Foundation of China(12102410);Fund of National Key Laboratory of Shock Wave and Detonation Physics(JCKYS2022212005)。

摘　　要：The lattice parameter,measured with sufficient accuracy,can be utilized to evaluate the quality of single crystals and to determine the equation of state for materials.We propose an iterative method for obtaining more precise lattice parameters using the interaction points for the pseudo-Kossel pattern obtained from laser-induced X-ray diffraction(XRD).This method has been validated by the analysis of an XRD experiment conducted on iron single crystals.Furthermore,the method was used to calculate the compression ratio and rotated angle of an LiF sample under high pressure loading.This technique provides a robust tool for in-situ characterization of structural changes in single crystals under extreme conditions.It has significant implications for studying the equation of state and phase transitions.高精度的晶格常数测量能够用于量化单晶的品质和材料的状态方程。为此,提出了一种迭代算法,用于求解基于激光单晶X射线衍射实验的伪Kossel投影中X射线与样品的作用点,从而提升晶格参数的测量精度。通过单晶铁的静态实验验证了该方法。随后,采用该方法获得了动态压缩下LiF单晶的压缩度和旋转角。这种方法为极端条件下单晶材料结构变化的原位表征提供了强有力的工具,在状态方程和相变研究方面具有重要意义。

关 键 词：lattice parameter measurement accuracy single crystal X-ray diffraction iterative algorithm high pressure ratio of compression 

分 类 号：O521.3[理学—高压高温物理] O521.2[理学—物理]