装药缺陷对浇注装药快烤响应特性的影响  

Effect of Charge Defects on the Fast Cook-off Response Characteristics of Cast PBX Explosive Charge

作　　者：梁明阳 智小琦[1] 于永利 肖游 LIANG Mingyang;ZHI Xiaoqi;YU Yongli;XIAO You(School of Electromechanical Engineering,North University of China,Taiyuan 030051,Shanxi,China;Jilin Jiangji Machine Special Industry,Ltd.,Jilin 132021,Jilin,China;Department of Intelligent Manufacturing,Automation Research Institute,Ltd.,China South Industries Group Corporation,Mianyang 621000,Sichuan,China)

机构地区：[1]中北大学机电工程学院,山西太原030051 [2]吉林江机特种工业有限公司,吉林吉林132021 [3]中国兵器装备集团自动化研究所有限公司智能制造事业部,四川绵阳621000

出　　处：《高压物理学报》2025年第4期56-67,共12页Chinese Journal of High Pressure Physics

摘　　要：为研究炸药装药缺陷对快速烤燃响应特性的影响,对Ⅰ型烤燃弹(无缺陷装药)和Ⅱ型烤燃弹(含缺陷装药)进行了快速烤燃试验。Ⅱ型烤燃弹的响应时间(128 s)短于Ⅰ型烤燃弹(132 s),且在5 m处的最大冲击波超压峰值(62.7 kPa)高于Ⅰ型烤燃弹(12.5 kPa)。试验结果表明,点火后Ⅱ型烤燃弹的响应较无缺陷的Ⅰ型烤燃弹更为剧烈,但二者的响应等级仍为燃烧反应。在此基础上,通过Fluent软件建立了池火与烤燃试件相互耦合的计算模型,模拟了试件在火焰中的受热情况。研究发现,缺陷越靠近装药表面,缺陷处的局部温度越高,但对装药的响应时间无明显影响。To study the effect of explosive charge defects on fast cook-off response characteristics,fast cook-off tests were conducted on type Ⅰ cook-off bomb(with defect-free charges)and type Ⅱ cook-off bomb(with defective charges).The results showed that the response time of type Ⅱ cook-off bomb(128 s)is shorter than that of type Ⅰ cook-off bomb(132 s),and the maximum shock wave overpressure at 5 m(62.7 kPa)is higher than that of type Ⅰ cook-off bomb(12.5 kPa).This indicates that the combustion of the type Ⅱ cook-off bomb was more intense than the defect-free type Ⅰ cook-off bomb after ignition,although both of them exhibit the same response level of burning reaction.Furthermore,a coupled computational model of pool fire and cook-off specimen was established to simulate the heating of the specimen in the flame using Fluent software.It is found that the closer the defect is to the charge surface,the higher local temperature at the defect,but it does not significantly affect the response time of explosive charges.

关 键 词：快速烤燃 池火模拟 装药缺陷 缺陷位置 

分 类 号：O521.9[理学—高压高温物理] TJ55[理学—物理]