基于光应力的紫外像增强管加速工作寿命试验研究  

Research on Accelerated Operating Life Test of Ultraviolet Image Intensifier Tube Based on Optic Stress

作　　者：王志荣 唐家业[1] 樊剑 WANG Zhirong;TANG Jiaye;FAN Jian(The 55th Research Institute of China Electronic Technology Group Corporation,Nanjing 210016,CHN)

机构地区：[1]中国电子科技集团公司第五十五研究所,南京210016

出　　处：《光电子技术》2025年第1期52-56,共5页Optoelectronic Technology

摘　　要：以紫外像增强管辐射增益作为监测变量,开展三组不同光应力水平的加速寿命试验,采用逆幂率模型及威布尔函数描述紫外像增强管的寿命分布,最终得到了紫外像增强管的寿命分布曲线。在此基础上对常规应力下紫外像增强管的寿命进行了预测。分析结果表明,紫外像增强管寿命服从威布尔分布,加速寿命模型符合逆幂率模型。In response to the lack of a unified life testing plan for ultraviolet image intensifier tube,three sets of constant stress accelerated operating life test which took radiation gain as variable were conducted.The inverse power-law and the Weibull function were used to describe the life distribution of ultraviolet image intensifier tube,Finally,the life distribution curve of ultraviolet image intensifier tube was obtained and the life under conventional optic stress was predicted.The research results showed that the operating life of ultraviolet image intensifier tube followed the Weibull distribution and the accelerated life model of ultraviolet image intensifier tube followed the inverse power law.

关 键 词：紫外像增强管 加速工作寿命 恒定应力 逆幂率模型 威布尔分布 

分 类 号：TN23[电子电信—物理电子学]