硅铁合金类自动脱膜法在X荧光光谱分析上的应用  

The Application of the Quasi-automatic Film-stripping Method in X-ray Fluorescence Spectroscopy Analysis of Ferrosilicon Alloys

作　　者：张宁宁 周晓英 李金晶 王庆 Ningning Zhang;Xiaoying Zhou;Jinjing Li;Qing Wang(Xinjiang Yili Iron and Steel Co.,Ltd.,Yili,Xinjiang 835802)

机构地区：[1]新疆伊犁钢铁有限责任公司,新疆伊犁835802

出　　处：《新疆钢铁》2025年第1期214-216,共3页Xinjiang Iron and Steel

摘　　要：在硅铁合金的化学成分分析中,传统化学湿法分析过程复杂且耗时,为简化过程,本研究采用四硼酸锂作为熔剂,并通过类自动脱膜法进行样品制备。制备出的硅铁合金标准样品具有不同梯度的组分含量,且含量范围广泛,从而形成一系列用于校准的标准样品/校准样品,有助于消除基体效应对分析结果的影响。此外,本研究还采用经验系数法来校正硅铁合金中各组分间可能存在的光谱增强与吸收干扰,成功建立利用X射线荧光光谱法测定硅铁合金中硅(Si)、铁(Fe)、锰(Mn)、铝(Al)、磷(P)等元素含量的分析方法。In the chemical composition analysis of ferrosilicon alloys,the traditional wet chemical analysis process is complex and time-consuming.To simplify this process,this study employed lithium tetraborate as a flux and utilized a quasi-automatic film-stripping method for sample preparation.The prepared ferrosilicon alloy standard samples have a gradient of component contents with a wide range,thus forming a series of calibration standards/standard samples to eliminate the matrix effect on the analysis results.Additionally,this study applied the empirical coefficient method to correct for possible spectral enhancement and absorption interference among the components in ferrosilicon alloys,successfully establishing an analytical method for determining the content of elements such as silicon(Si),iron(Fe),manganese(Mn),aluminum(Al),and phosphorus(P)in ferrosilicon alloys using X-ray fluorescence spectrometry(XRF).

关 键 词：类自动脱膜法 X荧光光谱分析 硅铁合金 

分 类 号：TF645[冶金工程—钢铁冶金]