Study on X-ray and electron-excited fluorescence spectroscopy of tungsten using TES  

作　　者：Bing-Jun Wu Jing-Kai Xia Shuo Zhang Robin Cantor Wen-Tao Wu Jin-Hua Li Xiao-Ming Xie Zhi Liu 

机构地区：[1]State Key Laboratory of Functional Materials for Informatics,Shanghai Institute of Microsystem and Information Technology,Chinese Academy of Sciences,Shanghai 200050,China [2]Center for Transformative Science,ShanghaiTech University,Shanghai 201210,China [3]University of Chinese Academy of Sciences,Beijing 100049,China [4]STAR Cryoelectronics,25-A Bisbee Court,Santa Fe,NM 87508-1338,USA [5]Center for Excellence in Superconducting Electronics,Chinese Academy of Sciences,Shanghai 200050,China [6]Key Laboratory of Earth and Planetary Physics,Institute of Geology and Geophysics,Chinese Academy of Sciences,Beijing 100029,China [7]School of Physical Science and Technology,ShanghaiTech University,Shanghai 201210,China

出　　处：《Nuclear Science and Techniques》2025年第4期119-126,共8页核技术(英文)

基　　金：supported by the National Key R&D Program of China(No.2022YFF0608303);the National Major Scientific Research Instrument Development Project(No.11927805);the NSFC Young Scientists Fund(No.12005134);the Shanghai-XFEL Beamline Project(SBP)(No.31011505505885920161A2101001);the Shanghai Municipal Science and Technology Major Project(No.2017SHZDZX02);the Open Fund of the Key Laboratory for Particle Astrophysics and Cosmology;Ministry of Education of China。

摘　　要：In the exploration of celestial bodies,such as Mars,the Moon,and asteroids,X-ray fluorescence analysis has emerged as a critical tool for elemental analysis.However,the varying selection rules and excitation sources introduce complexity.Specifically,these discrepancies can cause variations in the intensities of the characteristic spectral lines emitted by identical elements.These variations,compounded by the minimal energy spacing between these spectral lines,pose substantial challenges for conventional silicon drift detectors(SDD),hindering their ability to accurately differentiate these lines and provide detailed insights into the material structure.To overcome this challenge,a cryogenic X-ray spectrometer based on transition-edge sensor(TES)detector arrays is required to achieve precise measurements.This study measured and analyzed the K-edge characteristic lines of copper and the diverse L-edge characteristic lines of tungsten using a comparative analysis of the electron and X-ray excitation processes.For the electron excitation experiments,copper and tungsten targets were employed as X-ray sources,as they emit distinctive X-ray spectra upon electron-beam bombardment.In the photon excitation experiments,a molybdenum target was used to produce a continuous spectrum with the prominent Mo Kαlines to emit pure copper and tungsten samples.TES detectors were used for the comparative spectroscopic analysis.The initial comparison revealed no substantial differences in the Kαand Kβlines of copper across different excitation sources.Similarly,the Lαlines of tungsten exhibited uniformity under different excitation sources.However,this investigation revealed pronounced differences within the Lβline series.The study found that XRF spectra preferentially excite outer-shell electrons,in contrast to intrinsic spectra,owing to different photon and electron interaction mechanisms.Photon interactions are selection-ruledependent and involve a single electron,whereas electron interactions can involve multiple electrons witho

关 键 词：X-ray spectra X-ray emission spectra and fluorescence Superconducting transition-edge sensor X-RAY γ-ray spectrometers 

分 类 号：O57[理学—粒子物理与原子核物理]