零群速度导波表征薄板缺陷深度的数值模拟  

Numerical simulation of defect depth of ZGV guided wave characterization in thin plate

作　　者：李泽辉 陈思余 牛靖强 聂鹏飞[1,2] LI Zehui;CHEN Siyu;NIU Jingqiang;NIE Pengfei(Shanxi Key Laboratory of Intelligent Detection Technology&Equipment,North University of China,Taiyuan 030051,China;School of Information and Communication Engineering,North University of China,Taiyuan 030051,China)

机构地区：[1]中北大学智能探测技术与装备山西省重点实验室,山西太原030051 [2]中北大学信息与通信工程学院,山西太原030051

出　　处：《现代电子技术》2025年第8期1-6,共6页Modern Electronics Technique

基　　金：动态测试技术国家重点实验室基金(2023-SYSJJ-07)。

摘　　要：零群速度(ZGV)导波对于薄板厚度的变化非常敏感,在薄板厚度检测方面应用广泛。为了确定零群速度导波对于薄板中缺陷深度的表征能力,通过数值模拟方法模拟零群速度导波同表面缺陷和内部缺陷的相互作用,分析零群速度导波共振峰幅值、频率与缺陷深度之间的关系。结果表明:零群速度导波共振峰幅值的大小可以表征表面缺陷深度,共振峰幅值与表面缺陷深度之间呈现非线性关系;内部缺陷深度可根据零群速度导波共振峰频率表征,处于较高模态中的零群速度导波对内部缺陷深度的表征结果与实际深度之间呈现良好的线性关系。Zero group velocity(ZGV)guided waves are highly sensitive to changes in the thickness of thin plates and have found widespread application in the detection of thin plate thickness.In order to determine the characterization capability of ZGV guided waves for defect depth in thin plates,numerical simulation methods are used to simulate the interaction between ZGV guided waves and surface defects and internal defects,and analysis the relationship between the amplitude and frequency of ZGV guided wave resonance peaks and defect depth.The results indicate that the amplitude of ZGV guided wave resonance peaks can be used to characterize the depth of surface defects,and there is a nonlinear relationship between the resonance peak amplitude and the depth of surface defects.The frequency of ZGV guided wave resonance peaks can be used to characterize the depth of internal defects.ZGV guided waves in higher modes can exhibit a good linear relationship between the characterization results of internal defect depth and the actual depth.

关 键 词：零群速度导波 薄板厚度检测 缺陷深度 激光超声 数值模拟 共振峰幅值 

分 类 号：TN98-34[电子电信—信息与通信工程] TB533[理学—物理]