Three-Dimensional Reconstruction Method Based on Infrared Deflectometry  

作　　者：Ping XIONG Jing ZHAO Jinping CHEN Hao HU Jiangping CAO 

机构地区：[1]School of Materials and Environmental Engineering,Chengdu Technological University,Chengdu 611730,China [2]School of Network&Communication Engineering,Chengdu Technological University,Chengdu 611730,China [3]School of Optoelectronic Science and Engineering,University of Electronic Science and Technology of China,Chengdu610054,China [4]National Institute of Measurement and Testing Technology,Chengdu 610021,China

出　　处：《Photonic Sensors》2025年第2期63-69,共7页光子传感器(英文版)

基　　金：supported by the Talent Project of Chengdu Technological University,China(Grant No.2023RC013).

摘　　要：Deflectometry is a non-contact and rapid detection method with high sensitivity,which can be utilized in the areas of three-dimensional(3D)reconstruction,surface quality detection,and defect location.It has important applications in the automotive industry,optical parts manufacturing,and other fields.Classical deflectometry methods require the integration of slope data to reconstruct the absolute surface shape.However,the integration procedure is error-prone due to the accumulation of random errors into large shape deviations,resulting in inaccurate measurement results.In this paper,we extract the position of the centerline of the bright fringe from the stripe image and find the center of the fringe line point by point.Using the principle of triangulation,the 3D data for the object’s shaped surface can be obtained.In addition,infrared light enhances specular reflection,resulting in better deflectometry performance than that of visible light.Experiments show that the proposed method is sensitive to the changes in height and can roughly restore the surface topography of the object without calibration.

关 键 词：3D reconstruction infrared deflectometry stripe detection 

分 类 号：O436[机械工程—光学工程]