Different-Mode Power Splitters for Optical Testing of Three-Channel and Dual-Mode Waveguide Crossing  

作　　者：Hansi MA Te DU Xinpeng JIANG Zhaojian ZHANG Xin HE Huan CHEN Yang YU Zhenfu ZHANG Yunxin HAN Junbo YANG Yuanxi PENG 

机构地区：[1]Center of Material Science,National University of Defense Technology,Changsha 410073,China [2]College of Computer,National University of Defense Technology,Changsha 410073,China [3]School of Microelectronics and Physics,Hunan University of Technology and Business,Changsha 410205,China

出　　处：《Photonic Sensors》2025年第2期110-118,共9页光子传感器(英文版)

基　　金：supported by the National Key Research&Development Program of China(Grant No.2022YFF0706005);National Natural Science Foundation of China(Grant Nos.12272407,62275269,62275271,and 62305387);Foundation of National University of Defense Technology of China(Grant No.ZK23-03);Hunan Provincial Natural Science Foundation of China(Grant Nos.2022JJ40552 and 2023JJ40683);State Key Laboratory of High Performance Computing,National University of Defense Technology of China(Grant No.202201-12);the Hunan Provincial Innovation Foundation for Postgraduate,China(Grant No.CX20230009);State Key Laboratory of High Performance Computing,National University of Defense Technology of China(Grant No.202201-12).

摘　　要：We study that the different-mode(waveguide-connected)power splitter[(W)PS]can provide different-mode testing points for the optical testing.With the PS or WPS providing two different-mode testing points,the measured insertion losses(ILs)of the three-channel and dual-mode waveguide crossing(WC)for both the fundamental transverse electric(TE0)and TE1 modes are less than 1.8 dB or 1.9 dB from 1540 nm to 1560 nm.At the same time,the crosstalks(CTs)are lower than-17.4 dB or-18.2 dB.The consistent test results indicate the accuracy of the(W)PS-based testing circuit.Additionally,combining the tunable tap couplers,the(W)PS can provide multiple testing points with different modes and different transmittances.

关 键 词：Different-mode(waveguide-connected)power splitter testing points three-channel and dual-mode waveguide crossing 

分 类 号：TN253[电子电信—物理电子学]