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作 者:张淑敏 刘继奎[1] 周刚[1] 李睿 华啸锟 王巨圻 王健[3] 蒋俊[1] 来林[1] 张激扬[1] 张锦江[1] 李庆民[3] ZHANG Shumin;LIU Jikui;ZHOU Gang;LI Rui;HUA Xiaokun;WANG Juqi;WANG Jian;JIANG Jun;LAI Lin;ZHANG Jiyang;ZHANG Jinjiang;LI Qingmin(Beijing Institute of Control Engineering,Beijing 100190,China;China Aerospace Science and Technology Corporation Headquarters,Beijing 100048,China;School of Electrical and Electronic Engineering,North China Electric Power University,Beijing 100096,China)
机构地区:[1]北京控制工程研究所,北京100190 [2]中国航天科技集团有限公司,北京100048 [3]华北电力大学电气与电子工程学院,北京100096
出 处:《空间科学与试验学报》2025年第1期21-28,共8页Journal of Space Science and Experiment
基 金:空间站工程航天技术试验项目(2019HJS003)。
摘 要:航天器用导电滑环内部产生的带电磨屑不仅会加剧滑环环道磨损,还会造成电场畸变,诱发真空沿面闪络,影响太阳能电池阵列的工作可靠性。通过建立滑环模型,利用仿真模拟导电滑环内部电场、电势和磁场分布,进而研究带电磨屑的迁移运动规律,并进行在轨试验观测互相验证。仿真分析表明,静电场下导电滑环的内部电场最大值为2.65×10^(4) V/m,带电磨屑受到电场力的作用向绝缘挡板侧面运动并聚集,最大速度可以达到3.92×10^(-3) m/s。在空间电子辐照环境下,内部电场最大值为3.7×10^(8) V/m,出现在“三结合”点处,最大速度可以达到4.05×10^(-3) m/s,迁移运动更为明显。在轨试验证实,磨屑具有向绝缘挡板侧面移动和聚集的现象。本文揭示了航天器用导电滑环中带电磨屑的迁移运动规律,为导电滑环的绝缘优化设计提供了理论支撑和试验依据。The charged debris generated inside the conductive slip ring of the spacecraft will not only aggravate the wear of the slip ring,but also cause electric field distortion,induce vacuum flashover along the surface,and affect the working reliability of the solar cell array.In the paper,we simulate the distribution of the electric field,potential and magnetic field inside the conductive slip ring,and then study the motion of the live friction.Simulation analysis shows that the maximum internal electric field of the conductive slip ring under the electrostatic field is 2.65×10^(4) V/m,and the charged dust moves to the side of the insulated baffle,and the maximum speed can reach 3.92×10^(-3) m/s.In the space electron irradiation environment,the maximum value of the internal electric field is 3.7×10^(8) V/m,which appears at the“triple combination”point,and the maximum speed can reach 4.05×10^(-3) m/s,and the migration movement is more obvious.The on-orbit test confirmed that the debris moved and gathered to the side of the insulated baffle.This paper reveals the migration rules of the charged debris in the conductive slip ring,which provides theoretical support and test basis for the insulation optimization design of the conductive slip ring.
分 类 号:TM852[电气工程—高电压与绝缘技术]
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