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作 者:顾先宝 於国兵[1] 杜勤 闻德运 王金龙 刘毅 GU Xianbao;YU Guobing;DU Qin;WEN Deyun;WANG Jinlong;LIU Yi(Anhui Radiation and Environment Supervision Station,Hefei,230071,China;University of Science and Technology of China,Hefei,230027,China)
机构地区:[1]安徽省辐射环境监督站,合肥230071 [2]中国科学技术大学,合肥230027
出 处:《核电子学与探测技术》2025年第3期318-324,共7页Nuclear Electronics & Detection Technology
摘 要:使用传统的蒙特卡罗方法计算CdZnTe探测器探测效率时存在效率损失。为了将无源效率刻度技术应用于CdZnTe探测器,提出了基于理想模型(仅考虑光子与探测器晶体和结构材料相互作用过程)的CdZnTe全能峰源探测效率计算方法。使用^(152)Eu标准源样品验证了计算方法的可靠性,结果表明,计算结果与参考值的偏差不大于5%。该方法不需要考虑CdZnTe晶体内载流子不完全收集的复杂过程就可以得到可靠的效率计算结果,可操作性强。There is an efficiency loss in calculating the detection efficiency of CdZnTe detector using the traditional Monte Carlo method.Calculate the efficiency of CdZnTe detectors using sourceless efficiency calibration technique.A method for calculating the detection efficiency of CdZnTe based on the ideal model(only considering the interaction between photons and the detector crystal and structural materials)was proposed.A ^(152)Eu standard source sample was used to verify the reliability of the calculation method,the results show that the deviation between the calculated results and the reference values is less than 5%.This method does not need to consider the complex process of incomplete carrier collection in CdZnTe crystal,and can obtain reliable efficiency calculation results through simple operation process.
分 类 号:TL816[核科学技术—核技术及应用]
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