Enhanced Bragg Filter:A New Drift Correction Method for Low-dose High-Resolution STEM Images  

作　　者：WANG Yujiao ZHOU Jinfei LIU Dong LIU Lingmei LI Xiao ZHANG Daliang 

机构地区：[1]Institute of Advanced Interdisciplinary Studies&School of Chemistry and Chemical Engineering,Chongqing University,Chongqing 400044,P.R.China

出　　处：《Chemical Research in Chinese Universities》2025年第2期343-350,共8页高等学校化学研究(英文版)

基　　金：supported by the National Key Research and Development Project of China(No.2022YFE0113800);the National Natural Science Foundation of China(No.22309021).

摘　　要：High-angle annular dark-field scanning TEM(HAADF-STEM)images play a critical role in the structural characterization of chemical materials.However,drift correction is a critical challenge in imaging beam-sensitive materials,where sample motion and signal-to-noise ratio(SNR)hinder high-resolution image reconstruction.In this study,we propose an enhanced Bragg filter(EBF)method for robust drift correction and high-resolution reconstruction of HAADF-STEM images.The EBF method involves the semi-manual selection of reflection spots to extract periodic lattice features,which significantly enhance the SNR and preserve periodicity in low-dose images.We demonstrate the superior performance of the method by comparing it with conventional low-pass and band-pass filters.The effectiveness of the EBF method is validated on ZSM-5 zeolite crystals,achieving a spatial resolution of 1.25Å(1Å=0.1 nm)and enabling precise tracking of structural evolution under electron beam exposure.Furthermore,we apply the EBF method for super-resolution imaging of ZSM-5 at low magnification,enriching structural details without compromising the field of view.This study presents a robust solution for imaging beam-sensitive materials and advancing low-dose electron microscopy techniques.

关 键 词：STEM image series Drift correction Enhanced Bragg filter Beam-sensitive material Super-resolution 

分 类 号：O4[理学—物理]