QTL mapping associated with Verticillium wilt resistance in cotton based on MAGIC population  

作　　者：AYYAZ Muhammad CHANG Zewei DING Shugen HAN Peng XU Lin ABUDUKEYOUMU Abudurezike SIDDHO Irfan Ali LI Zhibo LIN Hairong XU Jianwei WU Yuanlong NIE Xinhui 

机构地区：[1]Key Laboratory of Oasis Ecology Agricultural of Xinjiang Production and Construction Corps,Agricultural College,Shihezi University,Shihezi,Xinjiang 832003,China [2]Institute of Crop Variety Resources,Xinjiang Academy of Agricultural Sciences,Urumqi 830091,China [3]National Central Asian Characteristic Crop Germplasm Resources Medium-Term Gene Bank(Urumqi),Urumqi 830091,China

出　　处：《Journal of Cotton Research》2025年第1期61-75,共15页棉花研究(英文)

基　　金：supported by funding from the fund for National Key Research and Development Program of China(2023YFD2301203-05);National Natural Science Foundation of China(32260510);Special Financial Project for Seed Industry Development in the Autonomous Region(BNZJ2024-10,BNZJ2024-30);Key Project for Science and Technology Development of Shihezi city,Xinjiang Production and Construction Crops(2022NY01);Shihezi University high-level talent research project(RCZK202337);Science and Technol-ogy Planning of Shuanghe city,Xinjiang Production and Construction Crops(2021NY02).

摘　　要：Background Cotton is an important cash crop in China and a key component of the global textile market.Verticil-lium wilt is a major factor affecting cotton yield.Single nucleotide polymorphism(SNP)markers and phenotypic data can be used to identify genetic markers and loci associated with cotton resistance to Verticillium wilt.We used eight upland cotton parent materials in this study to construct a multiparent advanced generation inter-cross(MAGIC)population comprising 320 lines.The Verticillium wilt resistance of the MAGIC population was identified in the green-house in 2019,and the average relative disease index(ARDI)was calculated.A genome-wide association study(GWAS)was performed to discover SNP markers/genes associated with Verticillium wilt resistance.Results ARDI of the MAGIC population showed wide variation,ranging from 16.7 to 79.4 across three replicates.This variation reflected a diverse range of resistance to Verticillium wilt within the population.Analysis of distribution pat-terns across the environments revealed consistent trends,with coefficients of variation between 12.25%and 21.96%.Families with higher ARDI values,indicating stronger resistance,were more common,likely due to genetic diver-sity and environmental factors.Population structure analysis divided the MAGIC population into three subgroups,with Group I showing higher genetic variation and Groups II and III displaying more uniform resistance performance.Principal component analysis(PCA)confirmed these divisions,highlighting the genetic diversity underlying Verticil-lium wilt resistance.Through GWAS,we identified 19 SNPs significantly associated with Verticillium wilt resistance,distributed across three chromosomes.The screening of candidate genes was performed on the transcriptome derived from resistant and susceptible cultivars,combined with gene annotation and tissue expression patterns,and two key candidate genes,Ghir_A01G006660 and Ghir_A02G008980,were found to be potentially associated with Verticillium wilt resistance.This suggests

关 键 词：Upland cotton Verticillium wilt MAGIC population Quantitative trait loci Association analysis 

分 类 号：S435.621.2[农业科学—农业昆虫与害虫防治]