数字集成电路参数测试的能力验证研究  

Research in Proficiency Testing of Digital Integrated Circuit Parameters

作　　者：孔宪伟 张欣苑 张浩 任翔[1] 

机构地区：[1]中国电子技术标准化研究院 [2]中国合格评定国家认可中心

出　　处：《信息技术与标准化》2025年第4期91-94,100,共5页Information Technology & Standardization

摘　　要：为提高国内集成电路测试实验室的质量控制水平,加快国内集成电路产品的推广和应用,中国电子技术标准化研究院赛西实验室组织国内32家检测实验室开展了能力验证活动,通过筛选和制备能力验证样品,设计实施了均匀性和稳定性测试过程,完成了数据统计分析,并提供了能力验证结果。本次能力验证活动有效地评估了国内相关实验室的技术水平,发现和识别了一些实验室在测试程序编写、测试操作过程中存在的问题,分析了问题产生的原因并提出了整改建议。In order to effectively improve the quality control level of domestic integrated circuit testing laboratories and accelerate the promotion and application of domestic integrated circuit products,CESI Laboratory has carried out capability verification activities for 32 domestic integrated circuit testing laboratories.Through screening and preparation of capability verification samples,a uniformity and stability testing process has been designed and implemented,data statistical analysis has been completed,and capability verification results have been provided.This proficiency testing activity effectively evaluated the technical level of relevant domestic laboratories,identified and identified problems in programming and operating of some laboratories,analyzed the causes of the problems and proposed rectification suggestions.

关 键 词：集成电路测试 能力验证 实验室比对 

分 类 号：TN407[电子电信—微电子学与固体电子学]