X射线成像闪烁体光产额测量技术与优化方法  

Light Yield Measurement Technology and Optimization Methods of X-ray Imaging Scintillator

作　　者：张誉戈 马舸 万鹏颖 鲍子臻 欧阳潇 刘林月[4] 欧阳晓平[4] ZHANG Yuge;MA Ge;WAN Pengying;BAO Zizhen;OUYANG Xiao;LIU Linyue;OUYANG Xiaoping(Department of Engineering Physics,Tsinghua University,Beijing 100084,China;School of Microelectronics,Xi’an Jiaotong University,Xi’an 710049,China;College of Nuclear Science and Technology,Beijing Normal University,Beijing 100875,China;Northwest Institute of Nuclear Technology,Xi’an 710024,China)

机构地区：[1]清华大学工程物理系,北京100084 [2]西安交通大学微电子学院,陕西西安710049 [3]北京师范大学核科学与技术学院,北京100875 [4]西北核技术研究院,陕西西安710024

出　　处：《发光学报》2025年第4期630-641,共12页Chinese Journal of Luminescence

基　　金：科技部重点研发计划项目(2021YFB3201000);国家自然科学基金(12050005)。

摘　　要：闪烁成像屏是X射线成像技术的核心部件,其光产额的精确测定对于提升成像系统的空间分辨率和推动新型闪烁体的研发具有至关重要的作用。本文首先概述了X射线成像技术的基本原理,随后系统地综述了当前X射线成像闪烁体光产额测量的主要方法。这些方法既包括基于能谱和X射线激发光谱的相对测量法,也涵盖了利用光电倍增管(PMT)和光电二极管(PD)或雪崩光电二极管(APD)的绝对测量法。同时,本文深入剖析了封装与耦合技术、放射源的能量特性与粒子种类、用于光产额测量的光电探测器种类等多种因素对光产额测量结果可能产生的潜在影响。另外,本文提出了一种基于光收集系数修正的绝对光产额测量方法。该方法有效地结合了利用PMT和PD的绝对法测量的优势,不仅能够实现大范围光产额测量,覆盖百光子量级的光输出,还保持了5%的低测量不确定度。Scintillation imaging screens are critical components in X-ray imaging technology.The accurate measurement of their light yield plays a pivotal role in improving the spatial resolution of imaging systems and advancing the development of new scintillators.This paper first provides an overview of the basic principles of X-ray imaging technology,followed by a review of the main methods for measuring light yield in X-ray imaging scintillators.These methods include relative measurement techniques based on energy spectra and X-ray excitation spectra,as well as absolute measurement methods using photomultiplier tubes(PMTs)and photodiodes(PDs)or avalanche photodiodes(APDs).Additionally,this paper summarizes the potential impacts of various factors on light yield measurements,such as packaging and coupling technologies,the energy characteristics of the radiation source,particle types,and the types of photodetectors used for light yield measurements.Furthermore,an absolute light yield measurement method is proposed based on correcting the light collection efficiency.This method effectively combines the advantages of the absolute measurement techniques using PMTs and PDs,achieving wide-range light yield measurements(covering light outputs at the hundred-photons level)while maintaining a low measurement uncertainty of 5%.

关 键 词：闪烁成像屏 光产额 测量方法 不确定度优化 

分 类 号：TL816.1[核科学技术—核技术及应用]