X射线光电子能谱仪(XPS)在纳米材料进行表征分析的应用与研究  

Application and Research of X⁃Ray Photoelectron Spectrometer(XPS)in Nanomaterials

作　　者：徐龙尾 XU Longwei(State Key Laboratory of Materials Chemistry Engineering,School of Chemical Engineering,Nanjing University of Technology,Nanjing 211816,Jiangsu,China)

机构地区：[1]南京工业大学化工学院材料化学工程国家重点实验室,江苏南京211816

出　　处：《流体测量与控制》2025年第2期55-57,共3页Fluid Measurement & Control

摘　　要：X射线光电子能谱仪(XPS)是一种利用X射线激发样品表面发射光电子,通过测量光电子的能量分布来分析样品表面化学信息的技术。XPS技术具有高灵敏度、高分辨率、无损伤、多功能等特点,是纳米材料表征分析的重要手段之一。本文介绍了XPS技术的基本原理、特点和优势,以及在金属纳米材料表征分析中的应用实例。讨论了XPS技术在纳米材料表征分析中存在的挑战和限制,以及需要改进和优化的方面,旨在为XPS技术和纳米材料表征分析的研究提供一个综述和参考。X-ray photoelectron spectrometer(XPS)is a technique that uses X-ray to excite the sample surface to emit photoelectrons and analyze the chemical information of the sample surface by measuring the energy distribution of photoelectrons.XPS technology has high sensitivity,high resolution,no damage and multifunction,and is one of the important means for nanomaterials characterization analysis.This paper introduces the basic principles,features and advantages of XPS technology,as well as the application examples in the characterization analysis of metal nanomaterials.The challenges and limitations of XPS technology in the characterization analysis of nanomaterials,and the aspects requiring improvement and optimization are also discussed.This paper aims to provide a review and reference for studies on XPS technology and characterization analysis of nanomaterials.

关 键 词：X射线光电子能谱仪 纳米材料 表征分析 

分 类 号：TH838[机械工程—仪器科学与技术]