基于相敏谱域干涉的折射率测量实验系统  

Refractiveindex measurement experimental system based on phase-sensitive spectral interferometry

作　　者：周红仙 王毅 ZHOU Hong-xian;WANG Yi(Experimental Education Center,Northeastern University at Qinhuangdao,Qinhuangdao,Hebei 066004,China)

机构地区：[1]东北大学秦皇岛分校实验教育中心,河北秦皇岛066004

出　　处：《大学物理》2025年第3期53-56,69,共5页College Physics

基　　金：国家自然科学基金(62075037);东北大学秦皇岛分校教学研究与改革项目(2023JG-A01)。

摘　　要：建立了基于谱域干涉的折射率测量方法及实验系统,系统主要包括光纤迈克耳孙干涉仪、光谱仪、线性拟合及相位去包裹方法.由光谱仪采集干涉信号,用线性拟合及相位去包裹得到高精度光程,进而计算折射率.用本系统测得晶圆、N-BK玻璃和蒸馏水的折射率分别为3.511±0.012、1.508±0.019、1.311±0.022,相对误差分别为0.23%、0.33%、0.37%.该方法可以对透明及半透明的固体及液体样品进行折射率测量,不需要对样品进行特殊处理,本系统体现了干涉技术的新发展及应用.A refractive index measurement method and an experimental system based on spectral domain interference have been established,which mainly includes a fiber-optic Michelson interferometer,a spectrometer,linear fitting and phase unwrapping methods.Interference signals are collected by the spectrometer,and high-precision optical path lengths are obtained using linear fitting and phase unwrapping methods,thereby calculating the refractive index.Using this system,the refractive indices of silicon wafers,N-BK7 glass,and distilled water are measured to be 3.511±0.012,1.508±0.019,and 1.311±0.022,respectively.The relative errors are 0.23%,0。33%,and 0.37%,respectively.This method enables refractive index measurements of transparent and translucent solid and liquid samples without the need for special sample treatment,showing a new development and application of interferometry technology.

关 键 词：干涉 相敏谱域干涉 折射率 相位去包裹 

分 类 号：O439[机械工程—光学工程]