偏振型数字散斑干涉波片全场测量方法  

Full-Field Measurement Method for Wave Plate Based on Polarization Sensitive Digital Speckle Pattern Interferometry

作　　者：高广鑫 牛海莎 吴思进[1] 匡翠方[2] 谢翟子 Gao Guangxin;Niu Haisha;Wu Sijin;Kuang Cuifang;Xie Zhaizi(School of Instrumentation Science and Opto-Electronics Engineering,Beijing Information Science and Technology University,Beijing 102206,China;State Key Laboratory of Extreme Photonics and Instrumentation,Zhejiang University,Hangzhou 310027,Zhejiang,China)

机构地区：[1]北京信息科技大学仪器科学与光电工程学院,北京102206 [2]浙江大学极端光学技术与仪器全国重点实验室,浙江杭州310027

出　　处：《光学学报》2025年第1期150-158,共9页Acta Optica Sinica

基　　金：国家自然科学基金(52075045);浙江大学极端光学技术与仪器全国重点实验室开放基金。

摘　　要：提出一种基于偏振型数字散斑干涉的波片全场相位延迟测量方法,通过分析不同偏振角度下的散斑干涉图来定位波片光轴方位角,应用空间载波相位提取和图像处理技术计算相位延迟,并以照明光场斜入射双折射模型补偿计算结果。实验结果表明,该方法对波片全场光轴方位角的判定精度为1.0°,全场相位延迟测量理论分辨率为0.012 rad,被测四分之一波片的全场相位延迟分布在1.588~1.605 rad范围内,满足波片全场快速测量需求。Objective Wave plates are polarizing devices with specific birefringence and play a vital role in optical systems.The optical axis azimuth angle and phase retardation are two key parameters of the wave plate,directly determining the performance of the optical system.Therefore,it is of great significance to rapidly and precisely measure the optical axis azimuth angle and phase retardation.Researchers worldwide have proposed numerous single-point measurement methods for wave plates,but full-field measurement of wave plates has not been achieved.In this study,we develop a full-field measurement method and system for wave plates based on polarization-sensitive digital speckle pattern interferometry(PS-DSPI).We obtain the speckle interferogram by beam-expanding illumination of the wave plate to be measured.We position the optical axis azimuth angle by analyzing the speckle interferogram of polarization states.We measure the phase retardation through spatial carrier phase extraction and image processing techniques.We analyze the error of full-field phase retardation.Laser beam expansion causes the light to enter the wave plate at an oblique incidence,which is an important error source.The method proposed in this study is significant for the full-field and rapid measurement of wave plate performance and extends the application range of digital speckle pattern interferometry(DSPI) in polarization.Methods The measured setup of PS-DSPI system is shown in Fig.1.The emitted light first is divided into object light and reference light by the beam splitter(BS).The object light passes through a half-wave plate(HWP),which is used as a polarization direction rotator.The polarization-adjustable light passes through the beam expander and illuminates the quarter-wave plate(QWP) to be measured.A polarization-maintaining metal plate is placed behind the QWP,and its scattered light is imaged on the target surface of the charge coupled device(CCD) through the imaging lens and the aperture.The reference light is coupled to a polarization

关 键 词：双折射 数字散斑干涉 偏振敏感 空间载波 斜入射 

分 类 号：TH741[机械工程—光学工程]