Microstructure and microwave surface resistance of YBCO films deposited under different oxygen pressures  

作　　者：Zhi-Bo Sheng Fu-Cong Chen Pei-Yu Xiong Qi-Ru Yi Jie Yuan Yu Chen Yue-Liang Gu Kui Jin Huan-Hua Wang Xiao-Long Li Chen Gao 盛智博;陈赋聪;熊沛雨;易栖如;袁洁;陈雨;顾月良;金魁;王焕华;李晓龙;高琛

机构地区：[1]School of Physical Sciences,University of Chinese Academy of Sciences,Beijing 100049,China [2]Institute of Physics,Chinese Academy of Sciences,Beijing 100190,China [3]Institute of High Energy Physics,Chinese Academy of Sciences,Beijing 100049,China [4]Shanghai Advanced Research Institute,Chinese Academy of Sciences,Shanghai 200120,China

出　　处：《Chinese Physics B》2025年第4期486-492,共7页中国物理B(英文版)

基　　金：Project support by the National Key Research and Development Program of China(Grant No.2022YFA1603900);the National Natural Science Foundation of China–Beijing Joint Fund(Grant No.U23A6015);Central University Basic Research Fund of China(Grant No.E1E40207X2);the Funds from University of Chinese Academy of Sciences(Grant Nos.E1EG0210X2 and 118900M018).

摘　　要：YBa_(2)Cu_(3)O_(7-x)(YBCO)films with low microwave surface resistance(RS)are essential for high temperature superconducting microwave devices.The oxygen pressure during deposition has been found to influence RS significantly.In this work,we deposited highly c-axis aligned YBCO films on single crystal MgO(001)substrates under different oxygen pressures via pulsed laser ablation.Their detailed microstructure was characterized with three-dimensional reciprocal space mapping(3D-RSM)method and their microwave surface resistance was also measured with resonant cavity perturbation method.We found that the variation of oxygen pressure can affect film microstructure,including grain orientation distribution and the concentration of crystal defects.The microstructure modulation can explain RS dependence on the oxygen pressure.

关 键 词：MICROSTRUCTURE microwave surface resistance reciprocal space mapping YBCO films 

分 类 号：O484[理学—固体物理]