X射线光电子能谱在法庭科学中的应用进展  

Application Progress of X-ray Photoelectron Spectroscopy in Forensic Science

作　　者：陆依 张巍[1] LU Yi;ZHANG Wei(College of Forensic Science,Criminal Investigation Police University of China,Shenyang 110854,China)

机构地区：[1]中国刑事警察学院法庭科学学院,辽宁沈阳110854

出　　处：《山东化工》2025年第7期132-135,共4页Shandong Chemical Industry

摘　　要：X射线光电子能谱是应用最为广泛的表面分析技术之一,实际上其在法庭科学的应用寥寥可数。通过综述X射线光电子能谱主要在鉴别炸药、分析爆炸残留物、分析射击残留物、分析油墨、分析指纹方面为法庭科学领域作出的诸多贡献,以期为广大同行带来些许启示和助益。X-ray Photoelectron Spectroscopy(XPS)has become one of the most widely used surface analysis techniques,but its use in forensic science is very low indeed.The literature review suggests a number of areas where XPS may be able to make a contribution in forensic science that is considered mainly include the identification of explosives and analysis of post-blast residue,GSR,ink and fingermark,for some illumination and help to the profession.

关 键 词：X射线光电子能谱 爆炸残留物 射击残留物 油墨 指纹 法庭科学 

分 类 号：O657.3[理学—分析化学]