基于CTIA的红外读出电路相关双采样实现方法  

Implementation method of correlated double sampling for infrared readout circuit based on CTIA

作　　者：丁健华 袁媛[2] DING Jian-hua;YUAN Yuan(School of Integrated Circuits,Shandong University,Jinan 250000,China;North China Research Institute of Electro-Optics,Beijing 100015,China)

机构地区：[1]山东大学集成电路学院,山东济南250000 [2]华北光电技术研究所,北京100015

出　　处：《激光与红外》2025年第4期562-568,共7页Laser & Infrared

摘　　要：读出电路作为红外探测器组件的关键组成部分,其噪声特性对信号读出以及整个成像系统的性能影响重大。噪声在信号传递的过程中是不可避免的,但可以通过降噪技术以及合理的设计来优化噪声性能。本文从分析红外探测器读出电路噪声入手,基于CTIA输入级仿真对比了两种相关双采样技术:像素级相关双采样和列级相关双采样。旨在根据不同的红外探测器的需求特点,选择更适合的相关双采样技术,以降低读出电路的开关复位噪声、MOS管噪声、FPN噪声,同时兼顾动态范围、线性度和功耗等要求。The readout circuit is a key component of infrared detector components,and the noise has a significant im-pact on signal readout and the performance of the imaging system.Noise is inevitable during signal transmission,but noise performance can be optimized by noise reduction techniques and reasonable design.In this paper,starting from analyzing the noise in the readout circuit of infrared detectors,two correlated dual sampling techniques are compared based on CTIA input-level simulation:pixel-level correlated dual sampling and column-level correlated dual sam-pling.The aim is to select a more suitable correlated dual sampling based on the requirements and characteristics of different infrared detectors to reduce the reset noise,MOSFET noise,FPN noise of the readout circuit,and while taking into account the requirements of dynamic range,linearity,and power consumption.

关 键 词：红外读出电路 低噪声 相关双采样技术 CTIA 

分 类 号：TN215[电子电信—物理电子学] O436[机械工程—光学工程]