利用FPGA实现红外焦平面阵列实时非均匀性校正  

Real-time nonuniform correction for IR focal plane array by using field programmable gate array

作　　者：孔令彬[1] 易新建[1] 王典洪[2] 叶敦范[2] 

机构地区：[1]华中科技大学光电子工程系,湖北武汉430074 [2]中国地质大学机电工程系,湖北武汉430074

出　　处：《光电工程》2002年第6期39-42,共4页Opto-Electronic Engineering

基　　金：武汉市科委资助项目(991002037G)

摘　　要：实时非均匀性校正是红外成像的一项关键技术。根据红外焦平面阵列探测元光谱响应的特点和基于参照源的两点温标非均匀性校正理论,提出一种利用FPGA硬件实现红外焦平面阵列实时非均匀性两点校正的新方法。该方法动态范围大、处理速度快,适用于红外成像系统实时图像处理场合。仿真和实验结果证明是可行的。Real-time nonuniform correction is a key technique for IR imaging. A new, real-time and uniform two-point correction method for IR focal plane array is carried out by means of Field Programmable Gate Array (FPGA) is proposed according to the spectral response characteristics of IR Focal Plane Array (IRFPA) detectors and nonuniform correction theory for two-point thermometric scale based on reference radiant point. The method has the advantages of large dynamic range and fast processing speed.It is suitable for processing image at real-time in IR imaging system. Both simulation and experimental results demonstrate that the method is feasible.

关 键 词：FPGA 红外焦平面阵列 非均匀性校正 现场可编程门阵列 红外成像系统 

分 类 号：TN215[电子电信—物理电子学]