金属化膜电容器接触电阻的计算  

Calculation of Contact Resistance of Metallized Film Capacitors

作　　者：林福昌[1] 徐智安[1] 何磊[1] 刘浩菊[1] 姚宗干[1] 

机构地区：[1]华中科技大学,武汉430074

出　　处：《高电压技术》2003年第1期35-36,共2页High Voltage Engineering

基　　金：国家863计划项目资助;编号2002AA833070

摘　　要：依据实验结果讨论了金属化膜电容器端部损坏机理。电容器端部喷金层与膜上金属蒸镀层的不完全连接性,是电容器损坏的主要原因之一。由端部接触电阻初步的建模计算分析了各种影响因素。On the basis of the result of experiments on metallized film capacitor, discussions on the end damage mechanism of metallized capacitors are presented. The incomplete connection between the spray end of metallized capacitor and metal layer of polymer film is the main cause of capacitor damage and failure. But there are few articles about calculation of the real contact-resistance. So in this paper, a mathematical model is built to calculate the end contact resistance of metallized capacitors, and different factors are analyzed.

关 键 词：金属化膜电容器 接触电阻 计算 

分 类 号：TM53[电气工程—电器]