两步相移实现投影栅相位测量轮廓术  

Two-Step Phase-Shifting Technique for Phase Measurement Profilometry by Grating Projection

作　　者：康新[1] 何小元[1] 

机构地区：[1]东南大学土木学院工程力学系,南京210096

出　　处：《光学学报》2003年第1期75-79,共5页Acta Optica Sinica

基　　金：国家自然科学基金 (10 0 72 0 17);非线性力学国家重点实验室开放课题资助课题

摘　　要：提出一种新的投影栅相位测量方法———两步相移法。该方法只需两幅相移条纹图 ,因此计算量小 ,速度快。给出了实验及计算结果 ,并同四步相移法进行了比较 ,证明了该方法具有较高的精度。The phase measurement method by grating projection is an effective technique in 3-D shape measurement. A novel method two-step phase-shifting technique for phase measurement profilometry is proposed. In this method only two phase-shifted fringe patterns are necessary in order to extract the phase values, and the phase unwrapping procure is not needed. Hence, this method requires little computing time. The experimental results are given. A comparison, which demonstrates the high accuracy of the new method, is made between the proposed two-step and conventional four-step phase-shifting method.

关 键 词：两步相移 投影栅 光学测量 相位测量轮廓术 三维形貌测量 图像处理 

分 类 号：O432.2[机械工程—光学工程] TN911.73[理学—光学]