超短脉冲X射线激发荧光寿命谱仪的设计与研制  

The development of an ultrashort pulsed X-ray facility for fluorescent lifetime measurement

作　　者：段勇[1] 顾牡[1] 梁玲[1] 马晓辉[1] 陈铭南[1] 

机构地区：[1]同济大学波耳固体物理研究所,上海200092

出　　处：《核电子学与探测技术》2003年第1期42-45,52,共5页Nuclear Electronics & Detection Technology

基　　金：教育部高等学校青年教师和骨干教师资助计划;国家自然科学基金(19274043);上海市教育委员会青年教师项目(01QN18)

摘　　要：介绍了一种利用超短脉冲X射线作为激发光源,用时间关联单光子计数法进行测量的荧光衰减时间谱仪的设计与研制。该仪器具有时间分辨率高、测量动态范围大、使用方便等优点,可应用于晶体、粉末和液体等各种样品的测量,该仪器同时还具有很强的扩展性。An ultrashort pulsed Xray facility has been developed for fluorescent lifetime measurement with the timecorrelated single photon counting method. It has advantages of good time resolution, wide timing dynamic range and being applied easily. It can be used to study samples with varied forms, such as crystal, powder, liquid, etc. And it has broad expansibility.

关 键 词：超短脉冲X射线 单光子计数 衰减时间 

分 类 号：TL812[核科学技术—核技术及应用]