同位素源激发X-射线荧光分析合金样品的吸收-增强效应的数学校正—基本参数法  

Mathematical Matrix Correction in X-ray Fluorescence Analysis——A Fundamental Parameter Method

作　　者：高志强[1] 陈坚[1] 

机构地区：[1]北京大学技术物理系,北京100871

出　　处：《分析化学》1992年第4期410-412,共3页Chinese Journal of Analytical Chemistry

基　　金：国家自然科学基金

摘　　要：本文叙述了利用基本参数法校正源激发合金元素荧光分析的基体效应的基本原理、基体效应的修正方法。讨论了当激发源的能量比元素的吸收限大很多时,吸收系数的散射修正,利用^(241)Am源激发,测量了铅锡合金和高合金钢样品中各元素的荧光强度,并用自编数据处理程序计算了元素含量,结果与标准含量进行比较。计算含量误差一般小于10％。The fundamental parameter method of X-ray fluorescence analysis has many advantages,such as no concentration range limitation of elements,dispensability of standard samples and so on. Furthermore, the accuracy of results is satisfactory. The principle of the fundamental parameter method and the slection of parameters have been described. The scattered correction of mass absorption coefficients has been discussed. The determining accuracy of this method in a series of Pb-Sn alloy and Fe-Cr-Ni alloy samples is better than 10％.

关 键 词：合金 X射线荧光法 吸收增强效应 

分 类 号：TG115.22[金属学及工艺—物理冶金]