实验室延伸X射线吸收精细结构谱仪——FXAS  

LABORATORY EXAFS SPECTROMETER-FXAS

作　　者：马礼敦[1] 沈孝良[1] 吕冈 金培生[1] 段永恒[1] 程广辉[1] 施国顺 

机构地区：[1]复旦大学分析测试中心

出　　处：《复旦学报（自然科学版）》1992年第3期294-304,共11页Journal of Fudan University：Natural Science

基　　金：国家自然科学基金

摘　　要：将一台12 kW转靶X射线粉末衍射仪改制为实验室延伸X射线吸收精细结构(EXAFS)谱仪FXAS.此谱仪具有平晶和弯晶两种单色晶体,有适用于粉末、薄膜、溶液的样品架及低温样品台,还配有双探头探测系统及双通道数据采集存贮接口,数据处理系统的主体是一台IBM-PC-AT微型计算机,数据处理软件包除包含常规换算,还有多种曲线拟合程序.谱仪的最大光子流为10~3S^(-1).能量分辨率在8 keV处随不同的实验条件而在5～10 eV变化.本谱仪用于非晶态材料、催化剂、过渡元素簇合物、配合物、超导材料等结构测定均获得满意的结果.A 12 kW rotating anode X-ray powder diffraciometer has been modi ed to be a X-ray absorption spectrometer FXAS. It has two types of monochromator, one is flat and the other is curved, three types of sample holder for powder, film and solution respectively, and a low temperature sample table, Two detectors are attached for the measurement of I_o and I. A bichannel interface is designed for collecting and storing the data of I_o, I and experimental conditions and for connecting the spectrometer with the data processing system. The main parts of the data processing is a set of IBm-PC-AT. In addition to the codes for data reduction and Fourier transformation, some routines for curve fitting are included in the data processing package. The maximum photon flux is about 10~8/s. The energy resolution at 8 keV is 5～10 eV depending upon experimental conditions. The FXAS has been used to study the structures of amorphous,catalysts, clusters, coordination compounds and superconductors. The results are satisfied.

关 键 词：精细结构 X-射线谱仪 FXAS 

分 类 号：O657.3[理学—分析化学]