利用薄膜量热计测量高功率Z箍缩软X射线总能量  

Measurement of total soft X-ray energy of high power Z-pinch plasma with a Ni-film bolometer

作　　者：王文生[1] 何多慧[1] 邱爱慈[2] 蒯斌[2] 罗建辉[2] 

机构地区：[1]中国科学技术大学国家同步辐射实验室,安徽合肥230026 [2]西北核技术研究所,陕西西安710024

出　　处：《强激光与粒子束》2003年第2期184-186,共3页High Power Laser and Particle Beams

基　　金：国家自然科学基金重点资助课题 (1 0 0 350 2 0 )

摘　　要：介绍一种采用脉冲恒压电源驱动的镍薄膜量热计 ,研制了测量系统和镍薄膜探测器 ,对探测器的电阻 温度特性进行了实验标定 ,该量热计已成功应用于测量“强光一号”加速器高功率Z箍缩等离子体软X射线总能量 ,分析了测量不确定度。A Ni-film bolometer driven by the pulsed constant-voltage supply was developed. The method of measuring the total soft X-ray energy and the measuring system was presented. A Ni-film detector was developed and calibrated for the dependence with temperature. This bolometer has been applied in measuring the total soft X-ray energy for the high power Z-pinch plasma produced from Qiangguang-I accelerator. The uncertainty of the measurement was analyzed.

关 键 词：薄膜量热计 测量 高功率Z箍缩 总能量 等离子体 软X射线诊断 

分 类 号：O536[理学—等离子体物理] TL65[理学—物理]