x射线衍射μ值法测定合成分子筛结晶度  

Determination of Crystallinity of Synthetic Molecular Sieve by μ Value Method of X-ray Diffraction

作　　者：储刚[1] 张璟[1] 王毅[1] 

机构地区：[1]抚顺石油学院应用化学系,抚顺113001

出　　处：《高等学校化学学报》1992年第1期100-102,共3页Chemical Journal of Chinese Universities

摘　　要：提出一种X射线衍射定量相分析法——μ值法,解决了无法得到待测晶相的标样或一组无非晶相的参考试样时含非晶相待测试样的定量问题。该法测定的结晶度只与待测试样的衍射强度和相的质量吸收系数有关,并采用最小二乘法回归分析,降低误差。The μ value method of the quantitative phase analysis by X-ray diffraction is presented. The method is used to determine the samples when no standard or reference samples can be found. In this method, the crystallinity determined is only related to the diffraction intensity of the samples and the mass absorption coefficients of the phases. The least square regressive analysis is also adopted to decrease the test deviation.

关 键 词：分子筛 结晶度 质量吸收系数 

分 类 号：TQ424.25[化学工程]