重叠伏安峰的样条卷积法分辨  

Spline Convolution for Resolving Overlapped Voltammetric Peaks

作　　者：张永清[1] 廖冬宁[1] 莫金垣[1] 

机构地区：[1]中山大学化学与化学工程学院,广东广州510275

出　　处：《分析测试学报》2003年第2期31-33,共3页Journal of Instrumental Analysis

基　　金：国家自然科学基金资助项目 (29975033) ;广东省自然科学基金资助项目 (980340)

摘　　要：建立了分辨重叠峰的样条卷积法 ;利用三阶样条函数构成的峰分辨函数与原信号进行卷积 ,直接对重叠的伏安峰进行处理 ,取得了较好的结果 ;被处理的重叠峰可达到基线分离 ,且峰位置的相对误差小于3.0 %(完全重叠峰为5.4 %) ,峰面积的相对误差小于2.0 %;应用于镉 (Ⅱ ) -铟 (Ⅲ )实验体系的微分脉冲伏安信号处理 ,取得满意的结果。A new method called as spline convolution(SC)for resolving overlapped peaks was proposed.A3rd order spline function was selected to construct peak resolving function.After original overlapped signals directly convoluted with the peak resolving function,the overlapped peaks were resolved.The overlapped voltammetric peaks simulated by computer were processed by this method and satisfactory results were obtained.The relative errors of peak areas and peak positions were less than2.0%and3.0%,respectively,except that the relative errors of the completely overlapped peaks were5.4%.The differential pulse voltammetric overlapped peaks of mixtures of Cd(Ⅱ)-In(Ⅲ)were investigated by this method,and satisfactory results were achieved.

关 键 词：样条卷积 峰分辨函数 分辨 重叠峰 

分 类 号：O657.14[理学—分析化学]