借助光栅测谱中高级次谱判断强激光场作用时的有效功率密度  

Experimental Method of Estimating Effective Laser Intensity by Use of the High-order Spectrum

作　　者：陈建新[1] 王骐[1] 夏元钦[1] 

机构地区：[1]哈尔滨工业大学光电子技术研究所可调谐激光技术国家级重点实验室,黑龙江哈尔滨150001

出　　处：《中国激光》2003年第3期255-258,共4页Chinese Journal of Lasers

基　　金：国家 8 6 3高技术 (86 3 80 4 7 1 0 )激光技术主题资助项目

摘　　要：借助在X光波段高次谐波辐射谱测量过程中 ,根据单色仪光栅分光的作用 ,产生的 2 3级次 (34 5 6nm)谐波谱的二级次谱 (6 9 1 3nm)的出现与否 ,判断了实验获得高次谐波谱的截止波长 ;从而根据高次谐波的理论 ,判断了强激光场与物质相互作用时 ,激励产生X光谱的有效功率密度为 1 0 0 7× 1 0 1 4 W /cm2 ,此时获得最大光子能量为32 81 7eV。Based on dispersion of grating in monochromator, the cutoff wavelength of getting harmonics is judged on the appearance of 2nd spectrum (wavelength of 69.13 nm) of the 23rd high-order harmonic (wavelength of 34.56 nm). Accordingly, the efficiency laser intensity of producing X spectrum is estimated in virtue of the theory of high harmonic which is 1.007×1014 W/cm2 and the most photon energy is 32.817 eV, which are the basic data of studying the origin and intensity of the spectrum in the experiment.

关 键 词：激光物理 光栅分光 高级次谱 测试系统 

分 类 号：O437.1[机械工程—光学工程]