对PDP障壁的高精度检验分析  

Analysis of High-precision-test for PDP′s Barrier

作　　者：顾智企[1] 章爱民[1] 

机构地区：[1]浙江大学信息显示研究所,浙江杭州310028

出　　处：《液晶与显示》2003年第1期40-43,共4页Chinese Journal of Liquid Crystals and Displays

基　　金：国防科工委"彩色等离子体显示板"资助项目

摘　　要：PDP中的障壁是决定显示板着火电压和亮度等主要光电参数的重要部件,在制作过程中加强障壁半成品检验,对提高显示板成品率和降低成本具有重要意义。本文介绍障壁的光阻挡立体检验方法系基于经典的光反射原理加之现代的图像处理技术而成,辅以一系列提高检验精度的措施后,对障壁外形检验精度可达±1μm,还可实现快速检测。The barrier in PDP is an important component. It determines photoelectricity parameters of PDP such as fire voltage, lightness. To enhance the test for semifinished barrier in manufacture process of PDP has important significance for increasing finalproductrate of the PDP and reducing its cost. This paper introduces the threedimensional lightblockoff test for barrier, this method based on classical theory of lightreflecting and modern technology of imageprocessing. After taking a series of measures for enhancing precision of the test, the precision becomes ±1μm. The speedy check could also be realized. 

关 键 词：等离子体显示板 障壁 PDP 光电参数 高精度检验分析 

分 类 号：TN873.94[电子电信—信息与通信工程] TN141.5