X射线荧光层析成像中消除散射光的方法  

A Method of Eliminating Scattered Light in X-Ray Fluorescent Tomography

作　　者：谢红兰[1] 高鸿奕[1] 陈建文[1] 陆培祥[1] 徐至展[1] 

机构地区：[1]中国科学院上海光学精密机械研究所,上海201800

出　　处：《光学学报》2003年第4期385-389,共5页Acta Optica Sinica

基　　金：国家 973项目;国家自然科学基金 ( 6 0 2 780 30 )资助课题。

摘　　要：介绍了X射线荧光层析成像技术的成像原理及其在微量分析领域中的应用。针对X射线与物质相互作用时 ,不仅产生荧光 ,而且会产生各种散射光 ,为消除这些散射光对成像结果的影响 ,提出采用在与入射X射线垂直方向放置一个圆环状的晶体单色器 ,即双聚焦模式晶体单色器 ,使荧光与各种散射光分离 ,并聚焦在探测器上。这样不仅大大增强了荧光信号的强度 ,而且可使荧光探测器小型化。The imaging principle of X-ray fluorescent tomography and its application in microanalysis field are introduced simply . Not only fluorescence but also various scattered light are produced while high energy X rays interact with substance. In order to eliminate the influence of these scattered light to imaging result, a method is proposed in which a doubly focusing crystal monochromator is placed normal to the accident X rays to separate X-ray fluorescence from the background and focuse it to a point on the detector surface. The method not only enhances the intensity of X-ray fluorescence but also permits the use of a smaller detector.

关 键 词：X射线荧光层析成像 散射光 成像原理 微量分析 晶体单色器 

分 类 号：O434.1[机械工程—光学工程] TH742.63[理学—光学]