EUT对TEM传输室特性阻抗影响的边界元分析  

Analysis of the characteristic impedance variation of TEM cell caused by equipment under test by BEM

作　　者：胡玉生[1] 蒋全兴[1] 张本军[1] 

机构地区：[1]东南大学机械工程系,南京210096

出　　处：《东南大学学报（自然科学版）》2003年第2期145-147,共3页Journal of Southeast University：Natural Science Edition

摘　　要：采用边界元法分析了金属箱体的受试设备对横电磁波传输室特性阻抗的影响 .计算结果表明 ,当受试设备不满足“三分之一准则”时 ,对特性阻抗的影响达 5Ω以上 ,当满足“三分之一准则”时 ,对特性阻抗的影响小于 2Ω .测量结果证实了计算方法的有效性 。The charcteristic impedance variation of TEM (transverse electromagnetic) cell caused by metallic EUT is analyzed by boundary element method (BEM). The results show that when the EUT (equipment under test) satisfies the 'one-third-area' rule, the characteristic impedance of TEM cell decreases by 2 Ω or less, or else the characteristic impedance will decrease by 5 Ω or more. The calculated results agree well with the measured ones. The results obtained are contributive to TEM cell design and EMC (electromagnetic compatibility) test.

关 键 词：EUT TEM传输室 横电磁波传输室 特性阻抗 边界元分析 受试设备 金属箱体 计算方法 

分 类 号：TN81[电子电信—信息与通信工程]