Measurement of Density Profile with Step-Swept Microwave Reflectometry  

作　　者：潘宇东 伊藤智之 

机构地区：[1]Southwestern Institute of Physics [2]Advanced Fusion Research Center,RIAM,Kyushu University

出　　处：《Plasma Science and Technology》2003年第2期1689-1694,共6页等离子体科学和技术（英文版）

摘　　要：A one-channel microwave reflectometer is used to measure the electron densityprofile in a low-density plasma experiment (n_e < 0.27 x 10^(19) m^(-3)) sustained by 2.45 GHzlower hybrid current drive (LHCD) on TRIAM-1M. In order to remove the effect of phase runawayphenomena, a step-like frequency-sweeping way is used and a special phase analysis technique isintroduced. The density profile is reconstructed in TRIAM-1M with the swept frequency ranged from 6GHz to 15 GHz. The corresponding cutoff density is from (0.045 ～ 0.28) x 10^(19) m^(-3) in theordinary polarization mode. The results are in good agreement with the measurements from amulti-channel 2 mm-wavelength interferometer.A one-channel microwave reflectometer is used to measure the electron densityprofile in a low-density plasma experiment (n_e < 0.27 x 10^(19) m^(-3)) sustained by 2.45 GHzlower hybrid current drive (LHCD) on TRIAM-1M. In order to remove the effect of phase runawayphenomena, a step-like frequency-sweeping way is used and a special phase analysis technique isintroduced. The density profile is reconstructed in TRIAM-1M with the swept frequency ranged from 6GHz to 15 GHz. The corresponding cutoff density is from (0.045 ～ 0.28) x 10^(19) m^(-3) in theordinary polarization mode. The results are in good agreement with the measurements from amulti-channel 2 mm-wavelength interferometer.

关 键 词：REFLECTOMETRY phase runaway phenomena electron density profile 

分 类 号：O536[理学—等离子体物理]