用X射线测定金属晶粒度的新计算方法  

The New Calculating Method Used for Measuring the Grain Size of Metal by X-rays

作　　者：蒋正行[1] 李玉昌[1] 刘国妹 

机构地区：[1]河北工学院材料系

出　　处：《河北工学院学报》1992年第4期48-55,共8页Journal of Hubei Polytechnic University

摘　　要：本文提出了一个借助于 X 射线测定金属晶粒度的新计算方法.在本文中,由 K_αX 射线产生的衍射线被认为是由 K_α_1和 K_α_2X 射线产生的衍射线的综合结果.如果用计算半高宽度 B_c 来代替衍射线的半高宽度 B,那么计算待测金属的晶粒度就变得容易了.与传统方法相比,新方法所得结果约小15%.新方法具有计算简单,不用标准试样的优点.当需要大致估计金属晶粒度时,新方法是有价值的.In this paper,a new calculating method used for measuring the grain size of metal by X-rays has been developed in which the diffraction line produced by K_a X-rays is considered as the comprehensive results of the diffraction lines of Ka_1 and Ka_2 X-rays.If the width of half height of the diffraction Iine B is replaced by so called the calculating width of half height Bc.It Will be very easy to calculate the grain size of metal waited for measuring.The res- ults calculated by this method in comparison with that of the traditional one is less about 15 percent.The new method has advantages that the calculating is simple without using standard specimen.It is valuable when the grain size of metal is estimated approximately.

关 键 词：X射线衍射 晶粒度 金属 

分 类 号：TG115.22[金属学及工艺—物理冶金]