平行板谐振法测量微波介质陶瓷介电性能  

The Measurement of the Dielectric Properties of the Microwave Dielectric Ceramics Using the Parallel Plate Resonator Method

作　　者：吕文中[1,2] 赖希伟[3] 

机构地区：[1]华中科技大学电子科学与技术系 [2]华中科技大学深圳研究院深圳信息陶瓷实验室,广东深圳518054 [3]华中科技大学深圳研究院深圳信息陶瓷实验室

出　　处：《电子元件与材料》2003年第5期4-6,共3页Electronic Components And Materials

基　　金：国家自然科学基金资助项目(60001002;60271021)

摘　　要：对平行板谐振法测量微波介质陶瓷的基本原理进行了阐述。介绍了该方法的硬、软件构成及其操作注意事项,并给出了部分测试结果。该方法具有测量简单、快速、准确的优点,但不适用于测量介质损耗较大的微波介质陶瓷。 r的测量误差为0.5%左右,Q值的测量误差为15%以下。The principle of the parallel plate resonator method for measuring the dielectric properties of microwave ceramics was presented. The measurement system is discussed, in regard with its configuration, the relevant software and the operation skills. Some measured results and the advantages of this method are given. The measurement method is simple, fast and accurate though not suited for the dielectrics of the microwave ceramics exhibiting relatively larger loss. The error of the measured r is about 0.5% and that of the measured Q below 15%.

关 键 词：平行板谐振法 微波介质陶瓷 介电常数 损耗 

分 类 号：TM28[一般工业技术—材料科学与工程]