大规模集成电路高温动态老化测试嵌入式图形发生系统的可编程ASIC实现  

Design of Embedded Graphic Generator for High Temperature Dynamic VLSI Burn-in Test System Using Programmable ASIC Technology

作　　者：冉立新[1] 

机构地区：[1]浙江大学信息与电子工程学系,杭州310027

出　　处：《仪器仪表学报》2003年第1期27-30,共4页Chinese Journal of Scientific Instrument

摘　　要：图形发生系统是大规模集成电路高温动态老化测试的核心子系统。在此 ,采用可编程 ASIC技术成功实现了这一系统。在体系结构及性能指标方面做了很大改进的同时 ,极大地减小了系统的 PCB尺寸 ,首次实现了嵌入方式。Graphic generator is the key subsystem of high temperature dynamic VLSI burn-in test system. An embedded graphic generator is developed successfully by applying programmable ASIC technology.The PCB dimension is reduced greatly as well as the architecture and performance are enhanced. This generator can meet the needs of small batch and multiple types of IC burn-in test in our country.

关 键 词：大规模集成电路 嵌入式图形发生系统 可编程ASIC 老化测试 

分 类 号：TN47[电子电信—微电子学与固体电子学]