基于多状态技术的材料电磁参数测量系统的研制  

The Development of a Setup for Measuring the Electromagnetic Parameters of Materials Based on Multi-state Techniques

作　　者：田步宁[1] 杨德顺[1] 唐家明[1] 刘其中[1] 

机构地区：[1]西安电子科技大学天线与微波技术国家重点实验室,西安710071

出　　处：《仪器仪表学报》2003年第1期40-44,56,共6页Chinese Journal of Scientific Instrument

基　　金：国防科技预研双基金资助项目 (.1 .1 .DZ0 1 4 5;.5.2 .DZ0 1 33)

摘　　要：介绍了一种基于多状态技术的材料电磁参数测量系统的原理 ,重点说明了四态四端口反射计 ,同时提出了一种利用二端口网络变换系数确定材料电磁参数的方法。给出了在 X波段对部分材料测量的实验结果。系统简单、精度高且易于实现。A setup for measuring the electromagnetic parameters of linear materials based on multi-state techniques is described with emphasis on a four-state and four-port reflectometer. A method for determining the electromagnetic parameters of materials is also presented by using the transformation coefficients of a two-port network. In addition, the experimental results of measuring materials at X-band are given. Simplicity, high accuracy and easy realization characterize the setup.

关 键 词：测量系统 研制 多状态技术 电磁参数 线性材料 不确定度 

分 类 号：TM93[电气工程—电力电子与电力传动]