MCT列阵光电性能参数自动测试系统  

Automatic Test System for Photoelectric Performance Parameters of MCT Arrsys

作　　者：邵式平[1] 

机构地区：[1]昆明物理研究所,昆明650223

出　　处：《红外技术》1992年第1期11-17,共7页Infrared Technology

摘　　要：本文介绍了霍尼威尔公司电光分部研制的MCT光电导列阵自动测试系统和洛克希德公司Palo Alto研究实验室研制的焦平面列阵光电参数的自动测试站。检测的光电性能参数包括光电响应率,响应光谱,噪声,探测器的RA乘积,响应频谱,光学串音和电学串音,响应率的空间频谱,调制传递函数等。An automatic measurement system for MCT photoconductor arrays which has been developed in Honeywell Electro-Optics Division and a computer-aided FPA test system of the Lockheed Palo Alt Research Laboratory are briefly de(?)cribed. The measured photoelectric performance parameter include photor(?)pon(?)e, spectral r(?)ponse, noi(?),detector RA product, frequ(?)ncy re(?)pons(?), optical and electrical cro(?)talk, spatial re(?)pon(?)e and MTF.

关 键 词：红外探测器 焦平面 自动测试 

分 类 号：TN215[电子电信—物理电子学]