低发射率材料红外法向发射率谱测量方法的研究  

STUDY OF THE METHOD FOR MEASURING NORMAL SPECTRAL EMISSIVITY FOR MATERIALS WITH LOW EMISSIVITY

作　　者：陈诗伟[1] 苏锦文[1] 张祖恭[1] 

机构地区：[1]中国科学院上海技术物理研究所红外物理国家实验室,上海200083

出　　处：《红外与毫米波学报》1992年第4期312-316,共5页Journal of Infrared and Millimeter Waves

摘　　要：采用热管技术研制了材料发射率谱的专用测量附件;利用双温测量技术,在P-E983型红外分光光度计及3600型数据站上进行了较低温度下低发射率材料红外法向发射率谱测量方法的研究.实测了几种材料的发射率谱;讨论了影响测量误差的诸因素.The design of a special accessory for measuring emissivities of materials by means of the heat pipe heater technique is reported. The measuring system consists of a P-E983 IR spectrophotometer, a model 3600 data station and a heat pipe heater. The measuring technique for low emissivities of materials is studied by means of a double tem- perature-measuring technique. The normal spectral emissivity curves of some materials are measured and the factors which will determine the measuring errors are discussed.

关 键 词：红外辐射 发射率 热管 

分 类 号：TN219[电子电信—物理电子学]