使用硅光电二极管自校准技术 建立激光微小功率标准的研究  

Research for the Use of Silicon Photodiode Self-calibration Technique as Standard of Mini-low Laser Power

作　　者：郭正强[1] 于靖[1] 张志新[1] 毛世华[1] 

机构地区：[1]中国计量科学研究院

出　　处：《计量学报》1989年第1期8-14,共7页Acta Metrologica Sinica

摘　　要：研究出一种使用硅光电二极管自校准技术建立激光微小功率标准的新方法。本文阐述自校准的原理和方法,并给出了4只硅光电二极管(UV-444B)在633nm波长下的绝对光谱灵敏度的自校准量值,其相对不确定度达到0.02％。A new method for establishment of a mini-low laser power standard using the self-calibration technique of silicon photodiode is investigated. The principle and measuring procedure of this method is also described. The absolute spectral respo-nsivities of four silicon photodiodes (UV-444B) at 633nm wavelength with an uncertainty of 0.02% were obtained using self-calibration technique.

关 键 词：硅光电管 自校准技术 激光功率标准 

分 类 号：TN241[电子电信—物理电子学]