CeO_2-Y_2O_3电解质薄膜等效电路研究  

Discussing on Equivalent Circuit of CeO_2-Y_2O_3 Thin Film

作　　者：张德新[1] 岳慧敏[2] 

机构地区：[1]郧阳师范高等专科学校 [2]华中科技大学

出　　处：《武汉理工大学学报》2003年第6期19-21,共3页Journal of Wuhan University of Technology

基　　金：湖北省教育厅重点科研项目资助 (2 0 0 3A0 0 3)

摘　　要：测量了采用溶胶 -凝胶法制备的 Ce O2 - Y2 O3电解质薄膜的阻抗谱 ,结果表明阻抗谱与薄膜的热处理温度有关。根据阻抗谱的变化及薄膜的 XRD图 ,提出了薄膜内部的模拟等效电路 ,并由此对不同热处理温度下薄膜的阻抗谱进行了分析。The complex impedance of CeO 2 Y 2O 3 thin film by using the sol gol dip coating method was measured. The results showed that the complex impedance spectroscopy was relevant to different heated temperatures. According to the change of complex impedance spectroscopy and XRD of ceria thin film, the equivalent circuit models of the thin film was recommended, and the complex impedance spectroscopy of the thin film was analyzed at different heated temperatures.

关 键 词：纳米CeO2薄膜 电解质 阻抗谱 等效电路 

分 类 号：O484.4[理学—固体物理]