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机构地区:[1]天津大学管理学院,天津300072
出 处:《吉林大学学报(工学版)》2003年第3期92-95,共4页Journal of Jilin University:Engineering and Technology Edition
摘 要:以x- R控制图为例,针对现行质量控制中以x-±3σ作为控制图控制界限的方法,通过分析控制图控制界限(Kσ)与两类错误(α和β)发生的概率及损失费用,提出了最优控制界限的观点。建立了两类错误损失费用的数学模型,给出了主要研究过程和最优控制界限(K)的算式。并通过实例对其优化结果和现行"x-±3σ"法的结果进行了比较和分析,说明了本文提出的方法的优化性。在此基础上,对其结果的一般性和优化性做了近一步的讨论和推广。Being aimed at the method which taken 'x-±3σ' as the control limits of control charts in quality control,took the x-R control charts for an example,a new opinion of the optical limits was pointed out through the analysis of the variation between the control limits of control charts (Kσ) and the probabilities as well as the costs of the two types of the errors (α and β).We established a mathematical model for its costs,gave out the major parts of the researching process and the optical formula for the control limits of control charts (K),and made a further discussion and extension for the generalization as well as the advantages of its results by the comparison with the results with x-±3σ method.
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