蔗秆表皮层的SEM-EDAX研究  

Study on the Cuticle of Sugarcane by Means of SEM-EDAX

作　　者：张树滨[1] 邱玉桂[1] 黄斌[1] 窦正远[1] 

机构地区：[1]华南理工大学制浆造纸工程国家重点实验室植物资源研究室,广州510641

出　　处：《中国造纸学报》2003年第1期1-6,共6页Transactions of China Pulp and Paper

基　　金：国家自然科学基金 (2 0 2 770 1 2;2 98760 1 2 );广东省自然科学基金 (980 596)

摘　　要：用SEM EDAX法研究蔗秆表皮层的超微结构及元素组成。结果表明 ,在实验条件下 ,蔗秆表皮层的外表面由C、O、Mg、Al、Si、Cl6种元素组成 ,Si的含量为 30 .464% ;颗粒状物的Si含量为 53 .833 %。蔗秆表皮层径切面中含C、O、Mg、Al、Si、K、Ca 7种元素 ,自外向里各种元素的含量呈规律性变化。表皮层是Si等矿质元素高度密集、超微结构非常复杂的多层结构 ;表皮层中的Si绝大部分在碱法制浆的低温蒸煮阶段就被溶解转移到黑液中 ,残留物几乎为纯C组成。蔗秆表皮层的超微结构、Si等元素的存在状态及脱除机理有待进一步研究。The structure and composition of the cuticle of sugarcane stem were studied by means of SEM-EDAX. The results showed that, the surface layer of the cuticle consists of six elements, such as C, O, Mg, Al, Si and Cl, the content of Si is 30.464%. In the granules of the surface layer, the content of silica is 53.833%. Seven sorts of elements i.e. C, O, Mg, Al, Si, K and Ca are found in the radial section of the cuticle. The contents of the elements change regularly from outer layer to inner layer. Ultrastructure of the cuticle layer is very complex. Element Si in the cuticle can be dissolved and removed easily at the low temperature stage of alkaline cooking, the remainder of the cuticle is consisted of almost pure C. The ultrastructure of the cuticle, existent state of the elements in the cuticle and the removing mechanism of them will be further studied.

关 键 词：蔗秆表皮层 SEM-EDAX法 超微结构 元素组成 造纸原料 硅干扰 脱除 

分 类 号：TS721.4[轻工技术与工程—制浆造纸工程]