多族晶面迹线分析方法及其应用  

METHOD FOR POLYFAMILY PLANE TRACE ANALYSIS AND ITS APPLICATION

作　　者：李玉清 

机构地区：[1]大冶钢厂钢铁研究所

出　　处：《金属学报》1992年第8期A359-A367,共9页Acta Metallurgica Sinica

摘　　要：导出了零倾动和非零倾动状态下各种晶系的薄晶中多族晶面迹线夹角的计算公式,并通过实例得到验证.应用这种分析方法可以标定滑移面、孪生面和其它面缺陷的迹线,特别是确定了M_7C_3中同时存在{011}和{013)孪晶等面缺陷。The formula for calculating included angle between polyfamily plane traces in foil of lattice systems under both zero tilt and non-zero tilt states was deduced and verified by certain practical examples. The method may be available to index the plane traces of slip, twin and other defects, especially to determine such plane defects as twin planes of {011} and {013} occurred simultaneously in M_7C_3.

关 键 词：多族晶面 迹线夹角 薄晶 倾动 

分 类 号：O766[理学—晶体学]