片式化高压电容器的内电极结构及优化  

The inner electrode structure and its optimization for high voltage chip capacitors

作　　者：王永力[1] 李龙土[1] 马振伟[1] 桂治轮[1] 

机构地区：[1]清华大学材料科学与工程系新型陶瓷与精细工艺国家重点实验室,北京100084

出　　处：《功能材料》2003年第4期414-417,共4页Journal of Functional Materials

基　　金：国家高技术研究发展计划(863计划)资助项目(2001AA320501)

摘　　要：　耐高压片式化多层陶瓷电容器(MLCC)要求其内电极具有特殊的结构以保证产品的可靠性。本文对比了普通MLCC和高压MLCC的内电极结构,用有限元方法对两种ML CC中若干典型位置的电场分布进行了分析,从电学角度对高压MLCC中内电极结构尺寸进行了优化,建立了高压MLCC内电极结构尺寸和所选用陶瓷介质材料的电学性能、MLCC的额定工作电压等参数之间的关系,这对中、高压MLCC的设计和制造具有指导意义。High voltage multilayer ceramic capacitor (MLCC) was provided with special internal structure to ensure its high reliability. In this paper the internal structures for common MLCC and high voltage one were compared in detail. The field distribution at some typical locations was analyzed via finite elements method, and the internal structure sizes for high voltage MLCC were optimized in the view of minimizing field concentration. A solution of the internal structure for high voltage MLCC was proposed upon given dielectric ceramic material and rated voltage of MLCC, significantly favoring the designing and processing of high voltage MLCC.

关 键 词：陶瓷电容器 片式化高压电容器 内电极结构 优化 有限元 

分 类 号：TM534.1[电气工程—电器]